You Mimura , Kazuyou Mizuno , Yoshitaka Iida , Kouji Masuda , Takahiro Itoh , Yasuhiro Nishi
Abstract
In wavelength-division multiplexing (WDM), which is fast emerging as mainstream technology to satisfy increased demand for fiber-optic communications, the erbium-doped fiber amplifier (EDFA) is a key device. Gain-flattening filters are used to produce flat gain characteristics within the bandwidth of the EDFA, and a number of methods have been proposed. The authors have developed a series of gain-flattening filter chips based on dielectric multilayer thin film, and by optimizing the thin film design, optical thickness control techniques and thin film deposition conditions to the requirements of the filters, have succeeded in producing gain-flattening filters for EDFAs with a gain of 13 dB, which have a flatness of 0.19 dB and an insertion loss of less than 0.1 dB.
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